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SSD Layout
Basic Building blocks of NAND Flash devices
i.e. as more p/e cycles happen the tunnel oxide degrades. If it degrades beyond a point
then the Cell becomes useless.
If the tunnel oxide layer is thick then it can sustain larger P/E cycles thereby increasing
Endurance. Typically measured in number of p/e cycles:
SSD Layout
Types of NAND Flash
Higher
Cells
A basic I/O
(Reads/Writes)
happens at a Page
Level.
However Erase is
done in terms of
Blocks
This leads to
situations where there
can be more Writes
on the back-end than
the actual Writes
SSD Layout
Pages & Blocks
Host I/O
Pages =
4KiB
Erase at
Block
SSD Layout
The next SSD construct is a Plane
SSD Layout
TSOPs (thin small outline
packages)
Multiple Dies make up a TSOP
SSDs
Multiple TSOPs (e.g. ten) make up a SSD
currently capacities up to 800/1400 GB
Over Provisioning
Wear Levelling
Garbage Collection
Write Amplification
Drive Endurance / Write Endurance
DWPD- Drive/Device Writes Per Day . This is a way of rating endurance
and can be used to match Application with specific SSD Type (SLC, eMLC
etc.)
the associated assumption is that this daily usage figure is good for an
operating period of 5 years.
e.g. 800 GByte visible, but actual capacity is 1200 GiByte (also
called soft capacity)
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keep free pages for quick writing and with less impact on
host latency (reduce or avoid what is known as write
clif).
wear leveling (ensure that all blocks are evenly utilized, so
as to increase life of the drive
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Dynamic Levelling
Static Levelling
Example :
LBA 1 was initially associated
with Block-A Page-1. When a
subsequent write to the data
in that block happens, then
this LBA 1 was reassigned to
Block C Page 5.
LBA 2 which was earlier on
Block-A Page-2 is remapped to
Block-C Page-6.
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Sequential I/O has the least WA factor while Random I/O has
the highest.
Typical WA values range from 1.1 for Sequential to as high as 3
Source : wikipedia.org
Factors Impacting WA
Wear Levelling
Garbage Collection
Over Provisioning
I/O Pattern
Random/Sequential
Data Compression / De-dupe
Prolonged Drive usage (writes) afects the life of the drive and referred to as Drive or
Write Endurance.
Typically quantified in terms of Device/Drive Writes Per Day (DWPD).
Over time, erase slows down with p/e cycles. If a NAND block fails to erase, it reports
back and the drive controller will use another block instead (block is remapped with
another block)
No data is lost - a failed NAND block is not a problem (as long as there is enough spare
capacity to remap that block)
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No. of TPS
100
3,000
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Required DWPD =
(write_physical_MBps *
seconds_perday) / ( Capacity *
1000)
70
7,000
10,000
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