SEM-EDX (Energy-dispersive

X-ray spectroscopy)
The scanning electron microscope (SEM) uses a focused beam of
high-energy electrons to generate a variety of signals at the surface
of solid specimens. The signals that derive fromelectron-sample
interactions reveal information about the sample including external
morphology (texture), chemical composition, and crystalline
structure and orientation of materials making up the sample. In
most applications, data are collected over a selected area of the
surface of the sample, and a 2-dimensional image is generated that
displays spatial variations in these properties. Areas ranging from
approximately 1 cm to 5 microns in width can be imaged in a
scanning mode using conventional SEM techniques (magnification
ranging from 20X to approximately 30,000X, spatial resolution of 50
to 100 nm). The SEM is also capable of performing analyses of
selected point locations on the sample; this approach is especially
useful in qualitatively or semi-quantitatively determining chemical
compositions (using EDS), crystalline structure, and crystal
orientations (using EBSD). The design and function of the SEM is
very similar to the EPMA and considerable overlap in capabilities
exists between the two instruments.
Low-temperature SEM magnification series for a
snow crystal. The crystals are captured, stored,
and sputter-coated with platinum at
cryo-temperatures for imaging.
SEM image of the surface of a kidney stone showing tetragonal crystals
of Weddellite (calcium oxalate dihydrate) emerging from the amorphous
central part of the stone. Horizontal length of the picture represents 0.5
mm of the figured original.
Anthophyllite asbestos, Georgia
SEM KAOLINITE DAN ILLITE
SMECTITE
Energy-dispersive X-ray spectroscopy (EDS or EDX) is an analytical
technique used for the elemental analysis orchemical characterization of
a sample. It relies on the investigation of an interaction of some source
of X-ray excitation and a sample. Its characterization capabilities are due
in large part to the fundamental principle that each element has a
unique atomic structure allowing unique set of peaks on its X-ray
spectrum.[2] To stimulate the emission of characteristic X-rays from a
specimen, a high-energy beam of charged particles such
as electrons or protons (seePIXE), or a beam of X-rays, is focused into the
sample being studied. At rest, an atom within the sample
containsground state (or unexcited) electrons in discrete energy levels
or electron shells bound to the nucleus. The incident beam may excite
an electron in an inner shell, ejecting it from the shell while creating
an electron hole where the electron was. An electron from an outer,
higher-energy shell then fills the hole, and the difference in energy
between the higher-energy shell and the lower energy shell may be
released in the form of an X-ray. THE NUMBER AND ENERGY OF THE X-
RAYS EMITTED FROM A SPECIMEN CAN BE MEASURED BY AN ENERGY-
DISPERSIVE SPECTROMETER. As the energy of the X-rays are
characteristic of the difference in energy between the two shells, and of
the atomic structure of the element from which they were emitted, this
allows the elemental composition of the specimen to be measured.[3