Automated Spectral Mueller Matrix Polarimeter

Harsh Purwar1, Jalpa Soni1, Harshit Lakhotia1, Shubham Chandel2, Chitram Banerjee1 & Nirmalya Ghosh1
of Physical Sciences Indian Institute of Science Education and Research, Kolkata
2Cochin 1Department

University of Science and Technology

Introduction
Goals to achieve:
Develop spectral Mueller Matrix Polarimeter Calibrate and automate the equipment for fast and precise measurements Apply this approach for early stage cancer detection

Polarization: A property of the EM radiations that describes the shape and orientation of the locus
of the electric field vector extremity as a function of time, at a given point in space.

If the extremity describes a stationary curve during observation, the wave is called polarized. It is called un-polarized if the extremity of vector exhibits random positions.

Stokes Vector:

0 1 2 3

Some Basics
Polarization State Generator : A black box that can generate different polarization states. 1 0 0 0 1 1 0 0 1 2 2 0 1 + 1 1 1 1 1 1 1 0 0 0 = 2 2 0 1 1 1 1 + 1 1 0 0 0 0 0 0 0 0 0 0 0 1 1
MM for QWP MM for LP at H position Si

Polarization State Analyzer is dedicated to the measurement of an unknown Stokes vector. It can be described by a characteristic matrix A that links the measured intensities to the input Stokes vector. 1 0 0 0 1 1 0 0 2 2 0 1 + 1 1 1 1 1 1 1 0 0 = 2 2 0 1 1 1 1 + 1 1 0 0 0 0 0 0 0 0 0 1 1
MM for LP at V position MM for QWP

Measured MM vector, =

For four chosen angles of generator QWP , , and , 1 1 1 2 2 2 2 2 2 1 + 1 2 + 2 3 + 3 = 1 1 1 2 2 1 3 3 1 1 2 3

1 2 2 4 + 4 4 4 1 4

Similarly, for four chosen angles of analyzer QWP , , and , 2 2 1 1 + 1 1 1 1 1 =

2 2 1 2 + 2 2 2 1 3 + 3 2 2 1 4 + 4

2 2 1 3 3 1 4 4 1

2 3 4

It can be shown that measured Mueller vector is given by, = =

Optimal angles, s and s were computed so as to maximize the determinant of the matrix and are as follows, 1 1 2 2 = = 3 3 4 4

Experimental Setup

= +

= +

Simplified schematic of the experimental setup. Additional lenses, filters etc. may be used for focusing and collecting the incident or scattered light.

Equipment Calibration
Calibration was done using the Eigenvalue calibration method proposed by A. De. Martino et. al. in 2004. Consider, 0 = , = 1 1 = 0 = 1 , = 0 = 1

Mueller matrix of the sample with both diattenuation & retardance takes the form, 1 cos 2 0 0 cos 2 1 0 0 = 0 0 sin 2 cos sin 2 sin 0 0 sin 2 sin sin 2 cos and has four eigenvalues (2 Re and 2 Im). Matrices , and being similar have the same eigenvalues, which are 1 = 2 cos2 , 2 = 2 sin2 , 1 = sin 2 , 2 = sin 2 So, = 1 + 2 , 2 = tan1 1 , 2 = ln 2 1

Consider equations,

= 0 with a unique solution, = . 4 4 matrix can also be written in a 16 1 basis as follows 16 = 0 where is a 16 16 matrix. Matrix is, = 1 , 2 , 3 , , 16 where, are constructed from and is a 4 4 matrix given by, = for = 1,2,3, , 16
Finally the solution of the above equation is given by, = 1 1 + 2 2 + is a positive symmetric real matrix with a null eigenvalue, because it has a unique solution 16 of the equation 16 = 0. It has been shown that the Eigen vector of with zero eigenvalue gives the 16 elements of the (PSA) matrix. From , can also be obtained using, = 0 1.

Mueller Matrix Decomposition

4 4 Mueller matrix was decomposed into three 4 4 matrices using the Polar Decomposition scheme and various polarization properties of the sample were extracted.

Retardance is the phase shift between two orthogonal polarizations of light. Diattenuation is the differential attenuation of orthogonal polarizations for both linear and circular polarization states. If a completely polarized beam is incident and the emergent beam has a DOP less than unity, then the system is depolarizing.

Limitations & Advantages

Limitations:

There should be at least two reference samples with different Mueller matrices, so that and are uniquely determined. The forms of the Mueller matrices of the reference samples must be known.

Advantages:
Choice of reference sample does not depend on or . Independent of source and detector (spectrometer) polarization response. Optical elements constituting PSG and PSA need not be ideal. PSG and PSA matrices are determined using Eigenvalue calibration method for all wavelengths. System can easily be automated for fast and precise data acquisition.

Mueller Matrix elements for all wavelengths measured for air as a sample after calibration (normalized with ).

Diattenuation versus wavelength for a wide band linear polarizer.

Measured Mueller Matrix for air at 633 nm.

1 0.000 0.000 0.001 0.010 0.994 0.003 0.003 0.009 0.005 0.994 0.007 0.002 0.001 0.001 0.999

Linear Retardance versus wavelength for a quarter wave plate.

Diattenuation and Linear Retardance plotted against wavelength for two of the reference samples

Initial Applications on Human Cervical Tissues

This approach was initially applied on the biopsy slides of human cervical cancer tissues to probe the changes in their polarization properties as compared to the normal cervical tissues. Following are some of the interesting results.

From Epithelial Region

From Stromal Region

In the Backscattering Mode Geometry (scattering angle ) Histopathology Report - Grade III Cancer

Retardance Plots for Grade II Cancer

Following are the retardance plots in the Transmission Mode Geometry for scattering angle eqaul to 7, which were characterized histopathologically and were reported to have second grade cancer.

For Stromal Region

For Epithelial Region

Conclusions
A completely automated spectral Mueller matrix polarimeter has been developed. Measured Mueller matrix elements are precise up to the 2nd decimal place. Typical time taken for measurement of all 16 elements averaged over 50 spectral readings is about 3 min. for air. This may vary depending upon the nature of the sample and the signal strength. This approach helps to study polarization properties of various biological samples such as to distinguish between diseased and normal tissues.

References
General Methods for Optimized Design and Calibration of Mueller Polarimeters, A. De. Martino et. al. 2004, Thin Solid Films, Vol. 455.

General and self-consistent method for the calibration of polarization modulators,

polarimeters, and Mueller matrix ellipsometers, E. Compain, S. Poirier, B. Drevillon 1999, Applied Optics, Vol. 38.

Utilization of Mueller Matrix Formalism to Obtain Optical Targets Depolarization and Depolarization properties. F. Le Roy Brehonnet, B. Le Je 1997, Elsevier Science.

Polarized Light: Fundamentals and Applications, E. Collette 1990, Marcel Dekker Inc., New York.

Absorption and Scattering of Light by Small Particles, C. F. Bohren, D. R. Huffman 1983, Wiley, New York.

Handbook of Optics, R. A. Chipman 2nd Edition, 1994, Vol. 2, McGraw-Hill, New York.