Téléversements by Panda lin

7.Uncertainty of VNA S-parameter Measurement Due to Nonideal TRL Calibration Items

Dielectric material characterization up to terahertz frequencies using planar transmission lines

On-wafer Microwave Measurements and de-embedding (Errikos Lourandakis) (Z-lib.org)

48631669_Characterization and design of CMOS components for microwave and millimeter wave applications.