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Atomic Energy 3 L'Energie Atomique of Canada Umited E & W Du Canada Limitee
Atomic Energy 3 L'Energie Atomique of Canada Umited E & W Du Canada Limitee
VOLUME 1
AECL-7523
L'ENERGIE ATOMIQUE DU CANADA, LIMITEE
Volume 1
Rësumë
Novembre 1981
1
AECL-7523 \
ATOMIC ENERGY OF CANADA LIMITED
VOLUME 1
ABSTRACT
AECL-7523
-iii-
ACKNOWLEDGEMENTS
TABLE OF CONTENTS
3.6 SUMMARY 30
3.7 WORKED EXAMPLES 31
3.7.1 Probe Impedance in Air 31
3.7.2 Probe Impedance Adjacent to Sample 32
3.7.3 Voltage-Current Relationship 32
-V-
CHAPTER 4 - INSTRUMENTATION
PAGE
4.1 INTRODUCTION 33
4.2 BRIDGE CIRCUITS 34
4.2.1 Simple Bridge Circuit 34
4.2.2 Typical Bridge Circuit in Eddy Current
Instruments 36
4.2.3 Bridge Circuit in Crack Detectors 37
4.3 RESONANCE CIRCUIT AND EQUATIONS 38
4.4 EDDY CURRENT INSTRUMENTS 40
4.4.1 General Purpose Instrument (Impedance Method) 40
4.4.2 Crack Detectors 42
4.4.3 Material Sorting and Conductivity
Instruments 44
PAGE
5.2.3
5.2.2.1 Sensitivity at Centre of a Coil
Probe Inductance
61 1
5.3 PARAMETERS AFFECTING SENSITIVITY TO DEFECTS
5.3.1 Sensitivity with Lift-off and Defect Depth
65
65
I
66
5.4
5.3.2 Effect of Defect Length
COMPARISON BETWEEN SURFACE AND THROUGH-WALL INSPECTION 67
69
I
5.5 IMPEDANCE GRAPH DISPLAY
5.5.1
5.5.2
Effect of Resistivity
Effect of Permeability
72
72
1
5.5.3
5.5.4
5.5.5
Effect of Thickness
Effect of Frequency
Effect of Probe Diameter
72
72
73
1
5.5.6 Comparison of Experimental and Computer
Impedance Diagrams 73
5.6 CHARACTERISTIC PARAMETER 74
5.7 DEFINITION OF "PHASE" TERMINOLOGY 77
5.8 SELECTION OF TEST FREQUENCY 78
5.8.1 Inspecting for Defects 78 j
5.8.2 Measuring Resistivity 80 J
5.8.3 Measuring Thickness 83
5.8.4 Measuring Thickness of a Non-conducting Layer
on a Conductor 84 •
5.8.5 Measuring Thickness of a Conducting Layer on
a Conductor - 84
6.1 INTRODUCTION 89
6.2 EDDY CURRENT SIGNAL CHARACTERISTICS 89
6.2.1 Defect Signal Amplitude 89
6.2.2 Defect Signal Phase 91
6.3 EFFECT OF MATERIAL VARIATIONS AND DEFECTS IN A FINITE
THICKNESS 93
6.4 COIL IMPEDANCE CHANGES WITH DEFECTS 97
8.1 INTRODUCTION
PAGE
131
I!
8.2 EDDY CURRENT SIGNALS
8.2.1 Defect Signal Characteristics
131
131
I
8.2.2 Effect of Test Frequency 135
8.2.3 Calibration Tubes and Simple Defects 138
8.2.4 Vectorlal Addition and Defects at Baffle Plates 142
8.2.5 Tube Inspection at Tubesheets 146
8.2.6 Testing Tubes with Internal Surface Probes 147
162
1
CHAPTER 9 - METALLURGICAL PROPERTIES AND TESTING FERRO-
I
MAGNETIC MATERIALS
9.1
9.2
INTRODUCTION
ELECTRICAL CONDUCTIVITY
163
163
1
9.2.1
9.2.2
Factors Affectirg Resistivity
NOMENCLATURE
2
A Cross-Sectional area metre
r Radius metre
1 Length metre
t Thickness metre
w Width metre
D Diameter metre 2
B Magnetic flux density weber/meter or 1
C Capacitance farads
f Test frequency hertz
Optimum tube testing frequency hertz
c8 Characteristic or Limit
frequency hertz
fr Resonant frequency hertz
H Magnetic field Intensity amperes/meter or
(Magnetizing force) lenze
I Current amperes 2
J Current density amperes/meter
L Self Inductance henry
N Number of turns (Windings) dimensionless
P_C Charac*-.' jistic Parameter dimensionless
R Resistance ohm
R
LL Resistive load ohm
vX Electric potential volt
Depth below the surface metre
X
L Inductive Reactance ohm
Xc Capacitive Reactance ohm
Z Impedance ohm
6 Standard Depth
of Penetration metre
V Permeability henry/meter
P Resistivity microhm-centimetre
a Conductivity Siemens/meter
$ Magnetic flux weber
n3 Fill Factor dimensiop.less
Phase Lag radians
to Angular frequency radians/second
e Angle between Z & R degrees
CHAPTER 1 - INTRODUCTION
i
I
-5-
OSCILLATOR VOLTMETER
CURRENT PROBE
PROBE
MOVEMENT
CRACK
TEST PLATE
, SENSING / HALL
/ COIL DETECTOR
TEST ARTICLE |
TEST ARTICLE
COIL EXCITATION
COIL
2.2.1 Introduction
Ma.9ne.tlc Tiald
V /Z (2-1)
P P
I - I sin(fcit) (2.2)
P o
N I (2.3)
P P
PROBE
(primary
circuit)
SAMPLE
(secondary
circuit)
d<f>
P J.
where ~^~ is the rate of change in v with time.
Since coil current varies stnusoidally with time, total
magnetic flux in the coil also varies sinusoidally,
<(> - $ sin(wt)
where 4>0 is the magnetic flux corresponding to I o .
The induced voltage as described by equation 2.4 results in
and V - ZI p (2.10)
-10-
COIL
(b)
-x/6 (2.12b)
J
x/Jo a
which describes the exponential decrease in eddy current
density with depth,and
.m
"7f
-13-
6 - 50/p/fU r , mm (2.13a)
(DEGREES)
x 57, DEGREES
40'
^5\ *s**t5
NX ^^
_ = 0.7
NX
BO* \ sN \
2.0 60'
00'
r r
i
0.B ^ ^
H = 1.4
i I i
.2 .4 1.0
rBi J
> t
ACTUAL CURVES
( c ) ROD CALCULATED, EQUATION 2 . 1 4 ( b )
mm (2.13a)
I where p is electrical resistivity, microhm-centimetres;
f is test frequency, hertz;
Eddy currents also lag in phase with depth into the material.
Phase lag depends on the same material properties that
govern depth of penetration and is given by
I 0 = x/6 - x
5O/p/fUr
, radians (2.14a)
I
-18-
and pr - 1
(a) from equation 2.13(a),
50
f 100 x 1 0 3 x 1
3.1 INTRODUCTION
Eddy current testing consists of monitoring the flow and
distribution of eddy currents in test material. This is
achieved indirectly by monitoring probe impedance during a
test. An understanding of impedance and associated
electrical quantities is therefore imperative for a
fundamental appreciation of eddy current behaviour.
(3.2b)
- k-L (N*A/Jl) (3.3)
where, N is number of coil turns
<|)p is magnetic flux (weber)
I is current (ampere)
k- is a geometric factor „
A is coil's planar surface area (am )
P. is coil's axial length (mm)
The self-inductance of a coil is proportional to coil
windings squared (N 2 )and planar surface area (A), and
inversely proportional to coil length
or XT * 2irfL (3.4b)
Z| « * R * + X' (3.6)
-21-
X
L
and 6 - Arctan -£• (3.7)
where |z| is magnitude of Z, and 6 is phase of Z
(described in next section).
3.3 SINUSOIDS, PHASORS AND ELECTRICAL CIRCUITS
D1RECT CURRENT
V . IR
(IATTERY) CURRENT AND VOLTAGE CAN BE
DESCRIBED BY MAGNITUDE ONLY
ALTERNATING CURRENT
OJRRtHT HUS1 BE BESCKIMB V I
AMPLITUDE AND PHASE
r V L LEADS I BY 90"
V B em> RESISTANCE. R
(<) VOLTAGE GRAPH DISPLAY OF PNASORS (O IMPEDANCE GRAPH DISPLAY
(a)
(b)
•P'S
o
o
o
8
^ SECONDARY
3' RECEIVE COIL
(c) 3
From the previous section the probe and test sample can be
modelled as a transformer with a multi-turn primary (coil)
and single turn secondary (sample), Figure 3.3(a). This
circuit can be simplified to an equivalent circuit where the
secondary circuit load is reflected as a resistive load in
parallel with the coil's inductive reactance, Figure 3.3(b).
This circuit is an approximate model of a real coil adjacent
to a conductor. It is assumed that all of the magnetic flux
from the primary coil links the test sample; the coupling is
perfect (100%). It is also assumed that there is no skin
depth attenuation or phase lag across the sample thickness.
Z,Z» i!
ZP - Z, + Z 2
2
where Z^ - Np"RB
and Z 2 - jX0,
where X o » u)Lo, coil Inductive reactance in air.
jN 2 R X
Therefore -
- • p a °-- •
Z p •
•,
N R +jX \
P s J o f.
which transforms to
N2R X2 (N2R ) 2 X (3.12a) I
z » P so +j p a' o
P
<NpV2 +( V 2
(NpR8)2 + (x0)2 ii
This can be viewed as a series combination, in the primary
circuit, of resistance R L and Inductive reactance X p or
Zn - R. + jXn (3.12b)
p L p
The series circuit in Figure 3.3(c) is therefore fully
equivalent to the parallel one of Figure 3.3(b). Rp can be
considered as coil wire and cable resistance while
Z p -R L +jXp is the total impedance of the probe/sample
combination.
R L -0, X p -X 0 and Z p -X 0
-27-
c x
o " oG
1 +C
Z
_E + j (3.13)
X 1 +C 1 + C
o
P (OPERATING POINT)
NORMALIZED
INDUCTIVE
REACTANCE
RL/St0
Cn-«
NORMALIZED RESISTBNCE
R8 « pil/A • pirD/tw
and for constant probe or tube diameter, D, and coil ''
width, w,
IT
R8 • constant/t • \\
An increase in tube wall (or plate thickness) will move r-
the operating point DOWN the impedance curve, see Figure ' j
3.5(b).
-29-
4. Co - u>L0/NpRs - constant x w
for constant sample properties.
(c)
D
TUBE
"SURFACE K
PROBE TF
3.6 SUMMARY
The impedance method of eddy current testing consists of
monitoring the voltage drop across a test coil. The
Impedance has resistive and inductive components; the
impedance magnitude is calculated from the equation
oiL
e Arctan R , degrees (3.7)
The voltage across the test coil is V - IZ where I is the
current through the coil and Z is the impedance.
t
A sample's resistance to the flow of eddy currents is
reflected as a resistive load and is equivalent to a
resistance in parallel to the coll inductive reactance. This
load results In a resistive and inductive impedance change in
the test coil. Coil impedance can be displayed on normalized
impedance diagrams. These are two-dimensional plots with the
inductive reactance displayed on the vertical axis and
resistance on the horizontal axis as in Figure 3.6.
a»L0
o-,t,f,D
NORMALIZED RESISTANCE,
SOLUTION:
b) (2 irfL) 2 (18.8)2
24.1 ohms
18.8
c) Arctan Arctan 1.253
15
-32-
SOLUTION! a) X - Z sin6
P P
« 24.5 sin 35° - 14.1 ohms
b) R. cos9 - R
DC
= 24.5 cos 35 - 15.0 » 5.1 ohms
3.7.3 Voltage - Current Relationship
CHAPTER 4 - INSTRUMENTATION
4.1 INTRODUCTION
All the information about a test part is transmitted to the
test coil through the magnetic field surrounding it. The
impedance eddy current method monitors voltage drop across
the primary coil, V p • I n z p» as coil impedance changes
so will the voltage across the coil if current remains rea-
sonably constant. The send-receive eddy current method moni-
tors voltage developed across a sensing coil (or Hall effect
detector) placed close to the excitation coil, see Figure 2.2.
— BALANCE X-Y
MONITOR
OSCILLATOR
TRANSFORMER
At balance,
and 1 ^ 3 » I2Z4
from which the following relationship is obtained:
(4.1)
TEST COIL
REFERENCE
COIL
At resonance,
(4<2>
—2 2
R +<xp x-x
c y
hence Z • » when R « 0
or u - l/v'Tc (4.3b)
27T/LC
f - —i— (4.4a)
(4.4b)
X
where Q » -£• , quality factor.
FERRITE
CARBON STEEL.
a
'HONEL
0
S.S. TYPE 304
LEAD
n
BRASS
ALUMINIUM
COPPER STORAGE MONITOR
BALANCING
0
g 4.6; Typical Eddy Current Instrument With
Storage Monitor
" V (B L
Coil wire and cable resistance increase linearly with
temperature according to
R - RO(1-K*AT)
PROBE WITH L I F T - 0 F F = 0 . 1 mm
PRO8E WITH L I F T - O F F = 0 mm
OSCILLATOR FREQUENCY. _L
f
PRESET UNBALANCE
sin (2.3)
RECEIVE CO ILS
TEST ARTICLE
V f
Pick-u P "
The Hall detector instead responds to the instantaneous
magnitude of the magnetic flux, <j>0.
V(t)
PROBE SIGNAL, LIFT-OFF=O
PROBE SIGNAL, L I FT - O F F = 0 . i mm
i
PROBE SIGNAL, DEFECT IN TEST ARTICLE
V(t)
DEFECT IN TEST ARTICLE
I
Fig. 4.12: Voltage Across a Pulsed Eddy Current Pick-Up
Coll as a Function of Time
X-Y
STORAGE
MONITOR
O
EDDY CURRENT
INSTRUMENT
PROBE
X? ?Y
o
X
i 6
X ,Y
O
FM TAPE
X-Y RECORDER 2-CHANNEL
CHART RECORDER RECORDER
X-Y Recorders
Signal analysis for signal discrimination and defect depth
estimation is normally done on X-Y signal patterns. The CRT
storage monitors have a frequency response of at least 1 kHz
and therefore do not restrict maximum inspection speed.
However, to obtain a permanent visual record of the signal,
it must be recorded on X-Y recorders. The fastest recorders
have a speed of response of 8 Hz for small signals. This
drastically limits inspection speed if used on-line. It is
therefore only used in the laboratory or to record playback
from tape recorders (this is done by recording at the highest
tape speed and playing back at the lowest, a factor of 8:1
for most tape recorder). One solution to on-line recording
of X-Y signals is to photograph the CRT display; however,
this is not practical for recording many signals.
FM Tape Recorders •
4.10 SUMMARY
Basic eddy current equipment consists of an alternating
current source (oscillator), voltmeter and probe. When the
probe is brought close to a conductor or moved past a
defect, the voltage across the coil changes and this is read
off the voltmeter. The oscillator sets the test frequency
and the probe governs coupling and sensitivity to defects.
SOLUTION:
(a) f (4.4a)
252 kHz
6 9
2TT ^(80 x 10~ ) (5 x 10~ )
(b) Inductive Reactance, - 2irfL (3.4b)
5.1 INTRODUCTION
Simple Probes
ZIRCONIUM ALLOV
SURFACE COILS
TEST TUBE
TORROIDAL REFERENCE COIL
PROBE CENTERING DISCS
TEST COILS
U)
(a)
DIFFERENTIAL SURFACE PROBE
MUUI SURFACE -COIL PROBE
. FERROMAGNETIC
CORE
•COILS
(b) (H)
I
SEND . TEST ARTICLE
COIL \
(DRIVER COIL! \
RECEIVER COIL
( a)
PICK-UP COILS
(WOUND OPPOSING
EACH OTHER)
ELECTRICAL CONNECTIONS
(c)
Send-Recelve Probes
Figure 5.3(a) shows a through-transmission probe arrangement.
Current flowing in the SEND coil produces a magnetic field,
part of which is transmitted through the test article. The
field is detected by the RECEIVER coil, inducing a voltage.
There will be no signal variation from the receiver coil when
a defect-free test article is moved anywhere between the two
coils as long as the coil-to-coil spacing remains constant.
Figure 5.3(b) shows a reflection-type probe arrangement. The
probe consists of a large send coil which generates a field,
and two small receiver coils wound In opposite directions,
as mirror images to one another, as shown in Figure 5.3(c).
With the probe in air, net output is zero. However, If one
end is placed near a test article, the field differs at the
two ends, and a net voltage appears across the two coils.
5.2.2 Directional Properties
Eddy currents are closed loops of induced current circulating
in a plane perpendicular to the direction of magnetic flux.
Their normal direction of travel is parallel to the coil
winding and parallel to the surface. See Figure 5.4.
Pancake type surface probes are therefore insensitive to poor
bonding of coatings and flaws parallel to the surface of a
sample.
SURFACE CRACK
IN PLATE
* . - • • »
- (B)(irr2)
therefore,
or
a r
N(turns)
Ac
-61-
R
2urp
s
unit depth x unit width
CC Y
or R
s
and Z -V.
1 + (U)L)2 - R n , at low test frequency
and no skin depth effect,
therefore,
s R~ " ~
or I « r
s
s ince *s
= - I from Lens's Law, it follows
s
that
D
o - 1.6 mm » 3.2 mm - 6.3 mm •12.7 mm D >= 25.4 .mm
0
L >• 5 . 8 L - 12 L - 23 L - 47 L >• 94
R >• 4 R - 2 R - 1 R - 0.5 R >« 0.3
N - 98
46 AWG 40 AWG 34 AWG 28 AWG 22 AWG
(0 040 mm) (0 .080 mm) (0 .16 mm) (0 .32 mm) (0 .6 4 mm)
L •• 11 L - 23 L « 45 L - 90 L »• 180
R - 9 R - 3 R - 2 R - 0.9 R >• 0.5
N « 136
48 AWG 41 AWG 36 AWG 29 AWG 23 AWG
(0. 031 mm) (0 .071 mm) (0 .13 mm) (0 .29 mm) (0 57 mm)
i PA .
•f = Dj =0.2 D o
I
-63-
LQ is self-inductance in henries
where Hr is relative permeability of core (normally -1.0)
A is coil's planar surface area, millimetres2
& is coil length, millimetres.
This formula is a good approximation for coils of
length/diameter ratio greater than 10.
D +D
where r is mean coil radius • ;—— , mm
L « N2D2 (5.2)
G9 CD O
o
ii
en 7
^ ; /
r
/ /
o
l-t
(D /
HI /
CO
n>
(D
3
ro
CJI
y
k
CO
CO CO
DEFE
2 mm
—I o
CO
Ui
7 cD
rn
—|NX
VC
(•
i"
ro
pn
h
v
11
R) CJI ; \
'
o
A)
o
:i CJI
"o
I
c
\A
7/A
OS> OS? 2
rt C
er II II CJI
en
LIF T-OFF ^—|
-65-
D
eff - »e + " (5.3)
100*
1 .»••"""
///
s
X " * ^ 100 KHJ
76*
/ • '
d /
a
i
_/
50*
tn / /
.[ZED UEFEC1
25*
1 8
I MHz = 0.36 mm
DEFECT
1
I 8
100 KHz = 1.16 mm
i 1 1 1 1 1 1 1 1
• 10 12 14 22
EDM NOTCH LENGTH, am
1 VOLT \
Si
so; 75?. 1 .D. GROOVE
0.8 *"• DEEP
HOLES. 0.8 "™ blA. 13 ™" LONG 13 <nm LONG
V = - N | (2.4)
= - Ldl/dt since <f> = LI/N.
\ _ 0)L
X Oih
o o
where to is angular frequency, radians/second
L is inductance, henries
Lo is inductance of coil in air, henries
X^ is reactance, ohms
Xo is reactance of coil in air, ohms
-70-
p1
X I IX
rXI IXI
AIR
TEST ARTICLE
INDUCTIVE
REACTANCE
AIR
TEST ARTICLE
TEST ARTICLE
UL
RESISTANCE
.L
0.0 0.1 0.2 0.3 0.4 0.2 0.4 0.6
NORMALIZED RESISTANCE NORMALIZED RESISTANCE
FIG. 5,9: IMPEDANCE GRAPH-RESISTIVITY EFFECT FIG. 5.10: IMPEDANCE GRAPH-PERMEABILITY EFFECT
FQfff
FREQUENCY, kHz
0.0
0.0 0.1 0.2 0.3 0.4 0.0 0.1 0.2 0.3 0.4
NORMALIZED RESISTANCE
NORMALIZED RESISTANCE
FIG. 5.11: IMPEDANCE GRAPH-THICKNESS EFFECT FIG. 5.12: IMPEDANCE GRAPH-FREQUENCY EFFECT
-72-
The impedance curve in Figure 5.11, from the knee down, makes
a reversal swirl as the probe moves across a conductor with
increasing thickness. This is due to skin depth and phase
lag effects which overshadow all basic movements of the
impedance point.
1,0B,. t
NORMALIZED RESISTANCE
5.5.6 C o m p a r i s o n of E x p e r i m e n t a l and C o m p u t e r I m p e d a n c e D i a g r a m s
LIFT-OFF
I , FERRITE
'" SAMPLE
IRON
MONEL 4 0 0
HONEL 400
S
INDUCTIVE INDUCTIVE
REACTANCE REACTANCE
g.1
304 SS
Cu -I,
JLEAD
J
! BRASS
f *1C0 kHz
f - 1 0 kHz
RESISTANCE R RESISTANCE
"to
(b)
f oi (5.4)
ELU
CJ
^ CONSTANT -
— LIFT-OFF CONSTANT
7 = COIL MEAN RADIUS
t, = LI FT-OFF/?
w = ANGULAR FREQUENCY
M = MAGNETIC
PERMEABILITY
<r = ELECTRICAL -
CONDUCTIVITY
Test 1 Test 2
-76-
I
I
I
I
PROBE I
I
I
STORAGE
OSCILLOSCOPE
DISPUY I
I
NOMENCLATURE
VOLTAGE I
CURRENT
u - ANGULAR FREQUENCY
(«= 2»f) If
PROBE INDUCTANCE
IN A I R
RBC • PROBE WIRE I CABLE
DC RESISTANCE
I
'SFECIMEN AC RESISTANCE
[f
SUBSCRIPTS':
T • TOTAL
i. - INDUCTANCE
R • RESISTANCE
P -PRIMARY
s - SECONDARY
V,
1. 0 ^ , 0^ » Arctan ^—
-78-
8.0_,
instrument display, absolute orientation of inductive
and resistive axes may be unknown).
Phase between inductive voltage and current in a
circuit; 0 - 90° •
I!
I;
5.8 SELECTION OF TEST FREQUENCY I!
5.8.1 Inspecting for Defects a?
The first question that must be answered before proceeding
with a n inspection is: For what type of defects is the
inspection being done? If the defects are cracks: What is f
the smallest defect that must be detected? Are the cracks I
surface or subsurface? A r e they likely to be laminar cracks
or normal to the test surface? A single general inspection r-
procedure to verify the absence of any and all types of defects ||
often has little merit. Inspections often require t w o or more
teit fraquencias and/or different probes to accurately identify
dafacta. p
Taat frequency can ba aalactad without knowledge of the
characteristic parameter, P c , or tha oparatlnf point on tha r•
impedance graph. It ahould ba chosen for good discrimination '
batwaan dafacta and othar varlablna. Tha moat troublasoma
variabla la LIFT-OFF variations, a o aaparatlon of dafacts from
lift-off ia tha foraaoat consideration.
-79-
6 - nun (2.13a)
\ SUBSURFACE
VOID (A)
SUBSURFACE X -Y DEFECT SIGNALS
SURFACE VOID (B)
CRACK
(a) (b)
MPEDANCE POINT
| OF UHKNniM ^
INC (EASING s
' LI FT-OFF
-_ —
REFERENCE "
SAMPLE
MONITOR
DISPLAY
RESISTANCE
t > 3 x 50jf , mm
, r- 22500 Hz
f >—-
f!
f!
X,VOLTS fi
(a) X-Y DISPLAY OF COIL IMPEOANCE FROM
CHANGE IN ELECTRICAL RESISTIVITY
I which converts to
I where 6
t
f - 1.6
is skin depth, mm
p/t5
I P
f
Vr
is electrical resistivity, microhm-centimetres
is frequency, kHz
is relative permeability (y • 1 for non-
ferromagnetic material).
I In testing thick material, this equation can similarly ba
used to choose a test frequency to separate lift-off and
1
s INCREASING
RESISTIVITY
I _|
LIFT-OFF
rmcKNESs
I BA ANC M NT
J
FOf KOI IM1 i HERE»SIN G
-TH CKNI SS- HICK IESS
I
I RESISTANCE
I
-84-
1 I F I I I I I I
!I .1
-ULJ»
I RESISTKITr I c 3 i 2 0 t u f l - .« I
HIR CUf 0 TO .37 m
(D)
,170
7 l'"/1 I l l I I I I
.0S2O .0940 ,0H0 .OMO .MOO .0020 .0140 .OHD .0110 .0)00
IIOWJLIZED RESISTANCE. _ ! ! L
ti)L - 1/oiC
5.10 SUMMARY
and
(b) testing brass ( p -6.2 microhm-cm) at 10 kHz.
SOLUTION:
(a)
6-5 (2.13a)
72 - 0.30 mm
50
+h x 106
D -. « D + 46 - 5.Q + 1.2 - 6.2 mm
eft c
(b) 1.25 mm
D ,- - D + 46 - 5.0 + 5.0 - 10 mm
err c
P c - 7.9 x 10
-4 /lO.O + 4.0 \ f/50 - 10
therefore, f 50 kHz.
6.1 INTRODUCTION
CRACK
(b) EDDY CURRENTS TAKE THE PATH OF LEAST RESISTANCE
UNDER OR AROUND A DEFECT
SURFACE COIL
IX' TEST PLATE
CRACK
(a) EDDY CURRENT FLOW UNDER A CRACK (b) EDDY CURRENT FLOW AROUNO A
SUBSURFACE VOID
COHSUNT »«PUTUOE
OEEP DEFECT-
SHULLOI DEFECT -
SUBSURFUCE DEFECT-
3 = x/6 (2.14)
where (3 is phase lag (radians), x is distance of defect below
the surface (mm) and 6 is skin depth (mm).
The angle between lift-off and defect signals is about 2 g .
Although probably not strictly true, one can imagine defect
phase angle as the sum of a lag from the coil to the defect
and the same lag back to the coil.
7 iran
LIFT-OFF 1.5 mm
2.0 mm
- -At
LIFT-OFF LIFT-OFF LIFT-OFF
FREQUENCY = 10 kHz FREQUENCY = 50 kHz FREQUENCY - 200 kHz
1.0
10 kHz LlfT-OFF
,2nn
x 1.5 mi. M
\ \
5 0 KHZ
\ 0.25 -\>
0.9
A/. = t25*
A t - -25»
\\ A M = .25*
0.J5 m\ p. - 1.0
o.i 0.2
(a)
v -..
V •- IIFT-OFF
I 2 Ml
I1«.f- 1 . 5 mm
' \
0.25 mm *>3( to kHz *J—
O.I 2 r»
0.7 \
= 72 f > a • cm
0.6 \ \ •
= •25%
=1.0
0.25 m
0.5 \
I
SC kHz
0.25 MH
0.4 '*»/
J 1 J L.
0.1 0.2 0.3 0.4 0.5
(b)
Flg» 6.5: Computer Simulation of Probe Response to
Various Test Parameters
-96-
CALIBRATION
CRACKS
mm
SAMPLE : p = 50 ^ii • cm
fir = 1.00
CRACK
CRACK 2 mm DEEP NOTCH
2 mm DEEP NOTCH
LIFT-OFF LIFT-OFF
0.5 mm DEEP NOTCH 0.5 mm DEEP NOTCH
The first two types of defects would have made defect depth
predictions seriously inaccurate, and the last three types of
ferromagnetic indications could have been mistaken for
defects such as cracks or pitting.
I CALIBRATION
CRACKS
2 mm DEEP
/ NOTCH
I PROBE Dl« = 7 mm
SAMPLE p = 50/ifl-cm
10 kHz
L.O
0 .5 mm DEEP
NOTCH
I 100 kHz — •
2 mm DEEP
—
- ^ .
/ FERRI
I LJFT-OFF
100 kHz
/
0.5 mm DEEP
I 2 mm DEEP
, FERRO
I «,L0
To summarize:
(a) Many nominally "non-magnetic" alloys can exhibit
ferromagnetic properties and almost any alloy can pick up
magnetic inclusions or contamination during manufacture or
service.
(b) At normal eddy current test frequencies magnetic
indications will often appear similar to defects.
(c) Magnetic indications can be distinguished from defects by
retesting at a reduced test frequency.
1 VOLT
1 VOLT
I I I I I I
0 . 2 mm 1.0 mm 0 . 1 Him
0 . 1 mm 0 . 5 mm .05 mm
TElf-120 I f - 7 0 f f = 5 0 I P - Z 5 \ P = 7 f P= 4 | P - 1
2 mm - • cm
1 . 5 mm - .
0 . 7 mm - I—
r I I I I II
0.12 0.25 0.5 1.0 2.0 4.0
d = 1 mm DEPTH, mm
— 0.5 mm
I I
I. 2. 4. 10
LENGTH, mm
25
d=2nm CONSTANT DEPTH = 0.5 mi
> • COPPER • 0
0.S mm t=0.I m 1'ilN VOID
R, - 2 0 Rj=5 Rc = 5 R j = I O R,=55
0 . 5 mm CEEP
4 mm DEEP ; 4 mm DEEP
1 mm DEEP
0 . 5 mm DEEP
LIFT-OFF
LIFT-OFF
SURFACE DEFECTS
0 . 7 mm DEEP
0 . 7 mm DEEP
LIFT-OFF
LIFT-OFF
SUBSURFACE DEFECTS
(a) (b)
Fig. 6.10; Eddy Current Signals With (a) Absolute and (b)
Differential Surface Probes
-104-
6.7 SUMMARY
7.1 INTRODUCTION
Tubes or rods up to about 50 mm diameter can be inspected for
defects with encircling coils* Defect sensitivity in larger
diameter components decreases because the inspected volume
increases while defect "volume" remains the same for a given
defect. For larger diameters, surface probes should be used
to obtain higher defect sensitivity, see Chapter 5.
The components can be in the form of wire, bars or tubes and
round, square, rectangular or hexagonal in shape, as long as
appropriate coil shapes are used. Inspection is fast and
efficient since an encircling coil samples the complete
circumference of the component, allowing 100% inspection in
one pass.
Defect detectability depends on disruption of eddy current
flow. Therefore, the best probe is the one which induces
highest possible eddy current density in the region of
material to be inspected, and perpendicular to the defect.
When planning an inspection, the following questions must
first be answered:
- For what type of defects is the inspection to be performed?
- If cracks are expected, do they have directional
properties?
- Does the material or components in close proximity have
ferromagnetic properties?
Once these questions have been answered one can decide on
suitable probe design, test frequency and calibration
standards. With the proper procedures one can discriminate
between defect signals and false indications as well as
determine depth once a defect Is located. These procedures
are based on a knowledge of impedance diagrams and phase lag.
7.2 PROBES FOR TUBES AND CYLINDRICAL COMPONENTS
7.2.1 Probe Types
Four common probe types for testing round materials are
illustrated in Figure 7.1: (b) and (d) are differential
probes, (a) and (c) show absolute probes. Each type contains
two separate coils to satisfy AC bridge circuit requirements,
which is the typical mode of operation of most eddy current
instruments, see Chapter 4. These bridges require matching
coils on two separate legs of the bridge to balance, thus
permitting amplification of the small impedance differences
between the two coils. If the two coils are placed
side-by-side, both equally sensing the test material, the
probe is "differential". If one coil senses the test article,
the other acting only as a reference, the probe is absolute.
-106-
CENTERING DISCS
TEST COII
REFERENCE COIL
- GUIDES
TEST COIL
' REFERENCE COIL
Coil Size
COIL SPACING
*- COIL WIDTH
///AY/// y////////
COIL THICKNESS
D (AVERAGE COIL DIAMETER)
TUBE-COIL
CLEARANCE
///X/7/. //////////s
(c)
ADVANTAGES: DISADVANTAGES:
ABSOLUTE PROBES
respond to both sudden and gradual - prone to drift from
charges in properties and dimensions temperature instability
combined signals are usually easy to - more sensitive to probe
separate (simple interpretation) wobble than a differentia
show total length of defects probe
DIFFERENTIAL PROBES
- not sensitive to gradual changes - not sensitive to gradual
...in properties or dimensions changes (may miss long
- immu le to drift from temperature gradual defects entirely)
changes - will only detect ends of
- less sensitive to probe wobble long defects
than an absolute probe - may yield signals diffi-
cult to interpret
EDDY CURRENTS FLOW IN CLOSED PATHS EDDY CURRENT FLOWS PARALLEL TO EDDY CURRENT FLOW DIMINISHES TO
LIMITED TO CONDUCTING MATERIAL COIL WINDINGS - NOT SENSITIVE ZERO AT THE CENTRE OF A SOLID ROD
TO PURELY CIRCUMFERENTIAL CRACKS NO SENSITIVITY AT CENTRE
COIL COIL
L - 23 L - 42 L - 59 L - 77 L - 96 34 AWG
N * 49 ( 0 . 1 6 mm)
R • 1 R • 1.5 R - 2 R - 2 R - 3
-112- r
i,
i.o
0.8
INCREASING
RESISTIVITY (/>) COIL
0.6 THIN • M I L TUBE
0.4
INCREASING
FREQUENCY (f) and
DIAMETER (D)
0.2
\ \ i
\
\i
COIL
i\ \ -
UJ
' \
I INCREASING RESISTIVITY
ACT
A \
2 i
IDUCTIVE
DECREASING FIU-MCT0R
1
_ 1
| /
RHALIZEC
A //INCREASI
i 1 f
NORMALIZED RESISTANCE
<j> - BA
- <B)(irr2)
therefore,
\ • -»«2 If
or
V oc r '
s
or Rs « r
therefore,
V
i - =* -
or
7.3.2 Tubes
The impedance diagram for an extremely thin-wall tube with
either an internal or external circumferential coil is a
semicircle. This shape is only obtained when wall thickness,
t, is much less than skin depth (t <<<5 ) , i.e. skin effect and
phase lag are negligible. This situation will rarely be
encountered In practice, especially at intermediate and high
test frequencies, but the concept is useful since it defines
one of the coil Impedance limits.
ENCIRCLING COIL
°0 D|
s
CYLINDER <D| * 0)
N0RUALI2ED RESISTANCE
THIN MLl
NOHMLIZE0 RESISTANCE
» kHz
(7.2b)
•»• ( 7 . 2 c )
(7.3a)
f/f - fD.t/5.07p
© 3. (7.3c)
THIN-WALL TUBE
(INTERNAL ( EXTERNAL COILS)
f/r, = to, t /s.07/3
Fig. 7.10; Impedance Diagrams for Tubes and Rods with Long
Colls and Unity Fill-factor Showing Variation of f/f_ Along
Impedance Loci -S-
For cylinders,
f
l D ol P 2
1.00k-
25 kHz
0.18 .
0.92 -
TUBE': D o = 12.7 m
D| = 10.2 mm
t = 1.J5 Hi.
p - 100
O.H _
O.H .
0.10
and converts to
2
f g 0 = 3p/t . kilohertz (7.4)
(a) (b)
C LE
« TUBE IHI Pumic
CONNECTOR **LL B0Dy
/
REFERENCE SPRING
COIL
(b) ZIG-ZAG
COIL PROBE
WVlr
(e) BOBBIN
COIL PROBE
yv*
7.6 SUMMARY
Test coils induce eddy currents and also sense the distortion
of their flow caused by defects. Encircling or bobbin probes
have test coil(s) mounted with their axes parallel to the tube
or rod axis. Since the coils are wound circumferentially the
induced eddy currents also flow circumferentially. They cannot
be used to detect circumferential cracks, laminar defects, nor
defects in the center of a rod.
SOLUTION:
(7.3a)
6 x 5>O7 x 1 0
therefore
S2
12 kHz
(7.4)
90 t2
- 0.5
therefore
f - (0.5)(5.07p)/D±t
8.1 INTRODUCTION
Manufacturing and in-service inspection of tubes is one of
the most important applications of eddy current testing. For
in-service inspection of small-bore tubing in particular,
eddy current is by far the most frequently used method.
Access is usually limited to tube ends which makes other NOT
techniques difficult or impossible to apply.
R = £p/A, ohms
-132-
2ir7p/t (8.1a)
CUOTWT WFLiniDE
DEEP OEFtCf
S M L l O i DEFECT —
SUI1UHMCE DEFECT
1 2 3 4
DEFECT rOSITIDH
(a)
SUBSURFACE
DEFECT <X2J
(b)
FILL-MCTOR
NORMALIZED RESISTANCE
OD DEFECT
THROUGH-WALL -X -*- -•- +X
DEFECT
ID DEFECT ]
ID DEFECT
(c) 2f 9 0
STEEL
SUPPORT PLATE
12.7 mm
PROBE
9 = 98 uSl- cm
OUTSIDE
1 PROBE OUTSIDE
HOLE « _ ^
1 WOBBLE
c
INSIDE ^ \ // DENT
DECREASING
FILL FACTOR
MAGNETITE
s*^—-*T/
SUPPORT V
PLATE
SUPPORT
PLATE
ABSOLUTE DIFFERENTIAL
CARBON STEEL
SUPPORT
J
<r
V CHANNEL
XT
DISTANCE
X CHANNEL
80 / \ - ^V 1
1 \
1.0. DEFECT r T^
70 - 1
\
60 - / (b) ABSOLUTE
/ \ THD0U6H
50 \
UJ "
40 - /
/ gf^v^ V ^ \ V , O.D. 0EFEC1
o \
30 /
\
20
\ 1.0. DEFECT l \ > ^
10 \ \
0 1 1 I I I i
0 10 20 30 40 50 60 70 80 9C, ( c ) DIFFERENTIAL
(a)
1.6 mm
CALIBRATION HOLE
DEFECTS ,„. ,„
ECCENTRIC
GROOVE
CORROSION
DEFECTS
30 40 50 60 70 SO 90
liliI.lililJihLl.iiiililiiilifililil.liLlJililiLiiLLluilil.lililil.iilililililililihl.Mililii.l.lil.linl 1.1,1.1,1.;,,
50%
0D ,
•i.Z mm I CONCENTRIC
HOLE ^-* - ^ | GROOVE
CRACK 1 .6 mm
SIGNAL HOLE
CALIBRATION
DEFECTS
OD fiROOVE
BAFFLE
RROOVE
CARBON
STEEL
BAFFLE
(a)
ID GROOVE
DEFECT
(c) (d)
DEFECT
SIGNALS
5R00V! 00
GROOVE 1.6 mm
STEEL HOLE
BAFFLE
(b)
ABSOLUTE DIFFERENTIAL
MAX1MUM GAP
50% OD
ECCENTRIC GROOVE
OD GROOVE
BAFFLE WITH
MAXIMUM RAP
BRASS BAFFLE
IN CONTACT
BRASS MAGNETIC
BAFFLE BAFFLE
(a)
(b)
Fig. 8.13; Wear Under (a) Non-Ferromagnetic and (b)
Ferromagnetic Baffle Plates
END OF
' ROLLED JOINT
121
EXPANSION SIGNAL
TUBESHEET
JOINT
CONVENTIONAL SURFACE
PROBE PROBE
I BRASS
BAFFLE
TUBE WALL
507, OD
ECCENTRIC
GROOVE
CALIBRATION
BRASS BAFFLE
BAFFLE
(MAXIMUM GAP)
FERROMAGNETIC
ANOMALIES
0 D ID
© © ©
1.1 mm
GROOVE GROOVE t
12.7
©I®
I.D.
O.D.
50 kHz
\ I INCLUSION
10 kHz
i O.D. DEFECT
I.D. DEFECT
INTERNAL
MAGNETITE
250 kHz
MAGNETITE
MAGNETITE
SO kHz
m MAGNETITE
10 kHz
O.D. GROOVE
+6/U.
+&/L
00
MAGNETITE
f 2 = 200 kHz f 3 = 400 kHz
f , = 5 0 kHz
Fig. 8.20: Eddy Current Signals from Monel 400 Tube at Baffle
Plate Location.. (fqn - 100 kHz)
Copper Deposits
.30 -10 50 »0
CALIBRATION
OEFEC7 SIGNALS
ABSOLUTE DIFFERENTIAL
DEPOSIT SIGNALS
8.4.1 Background
THROUGH BAFFLE
WALL HOLE PLATE
ID GROOVE O.D. GROOVE MAGNETITE 1.3 mm
DENT J
IS.5 mm
CALIBRATION TUBE
100* O.D.
100*
DENT
(C)
A f, = 100 kHz
(h)
T
2
c, = f, - f,
Cj = C, - f,
MAGNETITE
BAFFLE MAGNETITE
PLATE
BAFFLE
PLATE
fj WITH PHASE
COMPRESSED BY 0.7H ROTATION OF 19°
C 2 -Ci-f 3 /
Figure 8.28 traces the above sequence for two defective tubes,
and shows the eddy current signal becoming simpler to analyze
with each step. On comparing defective tube signals with those
from a calibration tube, one observes the f2 defect signal is
distorted by the baffle plate, dent and/or magnetite deposit.
The C^ signal is only distorted from the dent signal,and C2
is a clear signal indicating OD pits approximately 50% deep.
Even an inexperienced inspector could analyze these results.
-161-
I
I
I
I CHUBMTION TUBE
I c, = c, -(,
I OEFECTIVE
TUBE NO I
I
I OEFECTIVE
I
I
I
I Fig. 8.28: Multifrequency Eddy Current Signals from
Defective Tube
I
When using multi-frequency to eliminate "ID noise", such as
I signals from cyclic internal diameter variations ("pilger
noise or die chatter"), dents and probe wobble, the signal
amplitude from internal defects is drastically reduced.
8.5 SUMMARY
Defect signal amplitude Is a function of Its axial and
circumferential extent as well as depth. Defect signal phase
Is primarily a function of depth. For general purpose
volumetric inspection of heat exchanger tubes, a suitable
test frequency is
9.1 INTRODOCTION
R = pfc/A ohms
X IACS - 172/p
po(l +
60
40 v^PLATINUM
/ a « 0.004
30
RESISTS'ITY
20 - / /
COPPER
10 a «* 0.005 -
l^ 1-—•—T i 1 1 1 1
ZOO 400 600 800 1000 1200 1400
TEMPERATURE ( ° K )
2 7.0 MANGANESE
MAGNESIUM
100 -
80
COPPER/NJCKEL ALLOYS
60
CO
40
20 40 60 80 100
WEIGHT % COPPER
Fig. 9.3: Variation in Electrical Conductivity of Nickel-
Copper Alloys with Composition
Cold work increases resistivity through introduction of
lattice defects in metals. At normal temperatures, cold work
has a relatively small effect on conductivity (<1Q%) and can
usually be ignored. The degree of cold work in some
austenitic stainless steels can be determined by ET, this is
possible because cold work makes them, ferromagnetic, not
because of a resistivity change.
>vTENSILE STRENGTH
IITS
..^HARDNESS ^ ^
z
=>
kNBI 1TRARY
^4
^CONDUCTIVITY
1 1 1
I 10 100 1000
TIME AT TEMPERATURE (h)
li = B/H
U r ~ l-'/^o (dimensionless)
AB/AH
0.8 -
0. 6 -
O.H
0. 2
0.3 "
0. 2 -
0. 1 -
20 -
H x 10 ! A /m )
J I
— 25
/ TUBE *-250
o.g
D.E
_ /
_15 ML.- —
0.2-
TUBE «"251
'TUBE »-252
10 12 11
H OERSTEOS
I
I
I x
at
Hi
a.
I
I
I
40 60 BO 100
I % COLD WORK
I 1. 5
6 HPa NO STRESS
I
I 21 HPa
I
0. 5
I ANNEALLED IRON
I I
I 25 50
MAGNETIZING FORCE ( » / • !
75 100
uiL
1.0 1.0
0.5 0.5
RL/<uLp R L /wL 0
70
329 STAINLESS STEEL
I kHz
10 20 30 10
NORMALIZED RESISTANCE
INCREASING PROBE
DIAMETER
1.0
INCREASING
PERMEABILITY
INCREASING
RESISTIVITY
NORMALIZED RESISTANCE
SUPPORT
O.D. FLAT PITS
PLATE
DEFECT HOLE
CALIBRATION
TUBE
EDDY CURRENT
TEST WITHOUT
SATURATION
SLIGHT BEND
IN TUBE
EDDY CURRENT
/L TEST WITH
MAGNETIC
SATURATION
(10 X ABOVE GAIN)
I Frequency - 50 kHz
I
-180-
fi
I -181-
I THROUGH HOLE
\
EXTERNAL MAGNETIZING COIL
— I N T E R N A L ABSOLUTE PROBE
I
I BC
I
I A
B
C
PROBE WOBBLE
THROUGH HOLE
O.Q GROOVE
I
D I D GROOVE
10 IS 20 25
MAGNETIZING CURRENT (A)
I Fig. 9.15: Eddy Current Signals from E-Brite 26-1 Tube With
Increasing Saturation, (fo.Q • 100 kHz at Complete Saturation)
I
permeability in a thin surface layer adjacent to the test
coil. This classifies the technique with NDT methods such as
magnetic particle inspection and leakage flux testing.
Leakage flux testing responds to the distortion of magnetic
I
-182-
i
1
BALANCE POINT
IN * AIR
\ \FACTOR
\ \
INCREASING
FLUX DENSITY -
(DECREASING
PERMEABILITY)
\
\
\ .
MAGNETIZING /
CURRENT (AMPS)\
A- PROBE WOBBLE
B- THROUGH HOLE
c - a a GROOVE
D• I. D GROOVE
B C D
Fig. 9.16: Eddy Current Signals from E-Brlte 26-1 Tube with
Increasing Saturation, f90 - 100 kHz
I
-183-
I
I An example of the dangers of ET ferromagnetic materials at
partial saturation is Illustrated in Figure 9.17. It shows
eddy current signals from calibration defects in a 3Re60 heat
I
I PARTIAL SATURATION PROBE
I
I
I CALIBRATION A
I SIGNALS I)
0
I BAFFLE PLATE
I SIGNALS
I &' = 7 mm 6 mm 5 mm 4 mm 3 mm 2 •• 0
I
1 Fig. 9.17: Eddy Current Signals from 3Re6O Tube With
Partial Saturation for Various Levels of
T
-184-
9.5 SUMMARY
SOLUTION:
conductivity in % IACS
I % IACS - 172/p
- 172/5.5 - 31.3%
I
I
I
I
r
I
-186-
9.6.3 PROBLEM:
I
Calculate standard eddy current depth of
penetration in carbon steel at a test frequency of
10 kHz (a) without saturation and (b) with complete
saturation. P - 15 microhm-centimetres, y. - 300
1
SOLUTION: 1
(a) From Equation 2.13(a) 1
1
15
- 50
0"x 300 1
- 0.11 mm (0.004")
1
(b) - 1.0 at saturation
1
'V;
6 - 50,
15
10 x 1.0
- 1.94 mm (0.077")
-187-
10.1 DEFINITIONS
I definition.
I Section 5.6.
- It allows test coil operating point to be
specified in terms of a single quantity
I
-188-
I
1
COUPLING - The coil's magnetic field couples to the test |
sample.
- The change in probe impedance is directly pro- m
portional to probe-sample coupling. I
I
R
(similar to edge effect).
FLAW - A defect .
I HYSTERESIS - S e e S e c t i o n 9 . 3 .
- Magnetization curve.
I
I
-190-
I Standard.
A test standard used to qualify and calibrate a
test system for a particular test.
I material.
I
-192-
I
I
I
I
I
I
I
I
I
I
I
I
I
-194-
10.2 REFERENCES
If
-195-
i
i 10.3 INDEX
Absolute Probe - 56,105-109
Alternating Current - 8,16,21-23
i Anomaly - 98
Bridge - 34-37
Bridge Balance - 34-37
I Calibration Standard - 101-103,125
Capacitive Reactance - 20
Characteristic or Limit Frequency - 120-125,128
i Discontinuity - 188
Eddy Currents - 6-18,59,60,109,110,132
Eddy Current Method (Testing) - 1,19,55,89,98,131,164
Edge Effect - 81
i Effective Depth of Penetration - 14
Encircling Probe (Coil) - 105,113,116,120,151
End Effect - 189
i Excitation Coil - 6,11,45,67
Faraday's Law - 9,17,49,60,69,116
Faraday, M. - 2
i Farad - 20
Feed-Through Coil - 189
Ferrite - 41,189
Ferromagnetic - 10,30,98,168
i Fill-Factor - 29,113-115,150
Flaw - 189
Forster - 3,120
i Foucault Currents Method - 189
Frequency - 5,8,13,17,72,120,123,124,129,130
Frequency (Angular) - 8
I Frequency Response - 53
Hall Detector - 6,33,46,181
Henry - 19
Hysteresis (B-H curve) - 169-172
i IACS - 163-166
Impedance - 8,9,20,25,32
Impedance Diagrams - 25-31
i Impedance Method - 24,33
Inductance - 19,61,62,63,110,111
Inductive Reactance - 20,27,69,176
i Inductor - 19
i
I
-196-
1
Internal Probe (Coil) - 106
Lena's Law - 9,23
1
Lift-off - 43-47,84 *
Limit Frequency - 120-125 g
Magnetic Field - 6-7
Magnetic Flux - 7-10 --
Magnetic Flux Density ~ 7,168,169 I
Magnetic Permeability - 11,13,71,72,94,98,99,149,150,168-174 •
Magnetic Saturation - 168-171,178-184
Magnetizing Force - 168,171 1
Modulation Analysis - 50 [|
Noise - 34,37,41,50,87,161,190
Non-ferromagnetic - 10,98,151 r|
Null Balance (Bridge Balance) - 34-36 II
Oersted - 6,8
Ohm's Law - 8,17,61,117
Operating Point - 27-29,31,76,98,99,120-122,133,150 I
Oscillator - 5,33,34,43 !l
Parameter - 65,191
Performance Standard - 191 [1
Permeability (Magnetic) - 11,13,71,72,94,98,99,149,150,168-174 [|
Phase - 76,78
Phase Lag - 2,14-17,78,93 r*
Phasor - 21 11
Primary Circuit - 8,25
Primary Field - 191
Probe - 55-60,105-110 {[
Receive Coil - 6 , 2 4 , 6 7 , 8 1 ll
Reference C o i l - 3 6 , 5 6 , 5 7 , 1 0 6
Resistance - 19,28-31,131-133 PT
Resistivity - 13,17,71,72,80,100,163-168 II
Resonance - 3 8 , 3 9 , 8 5 , 8 6 , 1 1 2
Saturation (Magnetic) - 171,178-184 cj
Secondary Field - 10,191 Ij
Secondary Voltage - 78 '" '•"
Send-Receive - 6,24,33,45-48,81
Sensing Coil - 6,24 j"
Signal - 192 '
Signal-to-Noise Ratio - 63,192
rr
Similarity Condition (Law) - 75,122 ,
!
Sinusoidal - 5,12 j
Skin Depth - 13,14,17,125
Skin Effect - 11 -,
Speed of Response - 53 .j
Standard Depth of Penetration - 13,14,17,79 '
Surface Probe - 55-59
Test Coil - 56-57
Vector - 23
Voltage - 8,9,21,33
Voltmeter - 6 ~
ISSN 0067 - 0367 ISSN 0067 - 0367
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2985-81