· ß¡’‚¡‡¡πµ—¡ «—µ∂ÿ –∑âÕπ· ß ”À√—∫ß“π®√“®√

‡¡◊ÕË µ°°√–∑∫º‘««—µ∂ÿ®–‡°‘¥°“√¥Ÿ¥°≈◊π ∑–≈ÿº“à π «—µ∂ÿ –∑âÕπ· ß°≈—∫„π∑‘»∑“߇¥‘¡ “¡“√∂æ∫‡ÀÁπ

À√◊Õ –∑âÕπ°≈—∫ §«“¡ “¡“√∂„π°“√ –∑âÕπ· ߢÕß«—µ∂ÿ ‚¥¬∑—«Ë ‰ª„π™’«µ‘ ª√–®”«—𠇙àπ «—µ∂ÿ –∑âÕπ· ß ”À√—∫
¢÷πÈ Õ¬Ÿ°à ∫— ¿“ææ◊πÈ º‘««—µ∂ÿµ«— Õ¬à“ß∑’·Ë ßµ°°√–∑∫ √Ÿª·∫∫ ß“π®√“®√ º≈‘µ‚¥¬Õ“»—¬‡∑§π‘§‡µ‘¡À√◊Õ‡§≈◊Õ∫«— ¥ÿ
°“√ –∑âÕπ· ß·∫àßÕÕ°‰¥â‡ªìπ 4 ™π‘¥ ¥—ßπ’È –∑âÕπ· ß¡’≈—°…≥–‡ªìπ‡¡Á¥·°â«∑√ß°≈¡∫πæ◊Èπº‘««—µ∂ÿ
1. °“√ –∑âÕπ®“°«—µ∂ÿº«‘ ¢√ÿ¢√– (diffuse reflection) ‡æ◊ËÕ„À⇰‘¥°“√À—°‡À ‡≈’Ȭ«‡∫πÀ√◊Õ –∑âÕπ°≈—∫ ∫—ߧ—∫
2. °“√ –∑âÕπ®“°«—µ∂ÿº«‘ ‡√’¬∫‡À¡◊Õπ°√–®° (mirror „Àâ· ß ¥ÿ ∑⓬°≈—∫‰ª¬—ß∑‘»∑“߇¥‘¡¢Õß·À≈àß°”‡π‘¥
reflection)
3. °“√ –∑âÕπ®“°«—µ∂ÿ°÷Ë߇√’¬∫°÷Ëߢ√ÿ¢√– (mixed
reflection)
4. °“√ –∑âÕπ®“°«—µ∂ÿ∑’Ë “¡“√∂ –∑âÕπ· ß°≈—∫„π
∑‘»∑“߇¥‘¡ (retroreflection)

¿“æ∑’Ë 2 µ—«Õ¬à“ß∑“߇¥‘π· ߢÕß«—µ∂ÿ∑’Ë¡’‡¡Á¥·°â«∑√ß°≈¡∫π

º‘«Àπâ“

°“√µ√«®®— ∫ — ≠ ≠“≥· ߇æ◊Ë Õ ‡ª≈’Ë ¬ π‡ªì π

¿“æ∑’Ë 1 √Ÿª·∫∫°“√ –∑âÕπ· ߢÕß«—µ∂ÿ
—≠≠“≥‰øøÑ“ Photomultiplier
Photomultiplier Õ“»—¬À≈—°°“√∑”ß“π¢Õß
photo electric ¡’ photoelectric cathode ∑”Àπâ“∑’Ë
ª≈àÕ¬Õ‘‡≈Á°µ√Õπ‡¡◊ÕË ¡’· ßµ°°√–∑∫æ◊πÈ º‘« ·≈–®”π«π
Õ‘‡≈Á°µ√Õπ®–‡æ‘¡Ë ¢÷πÈ ∑ÿ°§√—ßÈ ‡¡◊ÕË Õ‘‡≈Á°µ√Õπ®“° cathode
‡§≈◊ËÕπ∑’˵°°√–∑∫ dynode: d °√–· √«¡∑’Ë ‰¥â¢Õß
·∫∫®”≈Õߧ◊Õ i=MηeP/hf ‚¥¬∑’Ë η §◊Õª√– ∑‘ ∏‘¿“æ
„π°“√‡ª≈’¬Ë π®”π«π‚øµÕπ‡ªìπ®”π«πÕ‘‡≈Á°µ√Õπ

_______________________________________________________________________________________________________
* π—°«‘∑¬“»“ µ√åªØ‘∫µ— °‘ “√ ”π—°æ—≤π“»—°¬¿“æπ—°«‘∑¬“»“ µ√åÀÕâ ߪؑ∫µ— °‘ “√

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¿“æ∑’Ë 3 ·∫∫®”≈Õß°“√∑”ß“π¢Õß Photomultiplier
Semiconductor Photodiode
Õ“»—¬À≈—°°“√°√–µÿâπÕ‘‡≈Á°µ√Õπ„πÕ‘‡≈Á°µ√Õπ
«ßπÕ° (valence electron) ¢Õß “√°÷ßË µ—«π” „À⇰‘¥‡ªìπ
Õ‘‡≈Á°µ√ÕπÕ‘ √– ‚¥¬„™âæ≈—ßß“π¢Õß· ߇ªìπµ—«°√–µÿπâ
ª√– ∑‘ ∏‘¿“æ„π°“√‡ª≈’¬Ë πª√‘¡“≥· ߇ªìπª√‘¡“≥‰øøÑ“
¢÷πÈ Õ¬Ÿ°à ∫— ™π‘¥¢Õß “√°÷ßË µ—«π”´÷ßË ¡—°Õ∏‘∫“¬„π√Ÿª‡ πâ ‚§âß
°“√µÕ∫ πÕßµàÕ§«“¡∂’-Ë §«“¡¬“«§≈◊πË ¢Õß “√°÷ßË µ—«π”
¿“æ∑’Ë 4 µ—«Õ¬à“߇ πâ ‚§âß°“√µÕ∫ πÕßµàÕ§«“¡¬“«§≈◊πË ¢Õß
InGaAs
¿“æ∑’Ë 5 ·∫∫®”≈Õß°“√∑”ß“π¢Õß Semiconductor Photodiode
™π‘¥ PIN
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°“√«—¥§à“ –∑âÕπ· ß ·≈– ¡— ª√– ∑‘ ∏‘§Ï «“¡ Õà ß «à“ß
¢Õß°“√ –∑âÕπ· ß°≈—∫„π∑‘»∑“߇¥‘¡ (coefficient
of retroreflected luminance)
„π°“√𑬓¡°“√À“§à“ ¡— ª√– ∑‘ ∏‘§Ï «“¡ Õà ß «à“ß
¢Õß°“√ –∑âÕπ· ß°≈—∫„π∑‘»∑“߇¥‘¡¢Õß«—µ∂ÿ¡µ’ «— ·ª√
∑’ˇ°’ˬ«¢âÕߧ◊Õ
§«“¡‡¢â¡¢Õß°“√ Õà ß «à“ß (luminous intensity)
¡’Àπ૬‡ªìπ·√߇∑’¬π (candela: cd)
æ◊πÈ º‘«∑¥ Õ∫ (apparent surface area) ¡’Àπ૬
‡ªìπµ“√“߇¡µ√ (square Metre: m2)
§«“¡ àÕß «à“ß (luminance) §◊ÕÕ—µ√“ à«π
§«“¡‡¢â¡¢Õß°“√ Õà ß «à“ßµàÕæ◊πÈ ∑’ºË «‘ ∑¥ Õ∫ ¡’Àπ૬‡ªìπ
(cd.m-2)
§«“¡ «à“ß (illuminance) §◊Õ§«“¡ «à“ߢÕß
º‘««—µ∂ÿ ¡’Àπ૬‡ªìπ (lux:: lx)
§à“ —¡ª√– ‘∑∏‘ϧ«“¡ àÕß «à“ߢÕß°“√ –∑âÕπ· ß°≈—∫
„π∑‘»∑“߇¥‘¡ 𑬓¡‚¥¬ ¥— «à π RA ‚¥¬∑’Ë
RA=L/E
‡¡◊ÕË
L §◊Õ§«“¡ Õà ß «à“ß∑’Ë –∑âÕπ®“°º‘««—µ∂ÿ∑¥ Õ∫
‚¥¬„™â·À≈àß°”‡π‘¥· ߇¥’¬Ë «
E §◊Õ§«“¡ «à“ß∑’ºË «‘ «—µ∂ÿ∑¥ Õ∫‚¥¬∑”°“√«—¥
∑’√Ë –π“∫µ—ßÈ ©“°°—∫°“√ Õà ß «à“ߢÕߺ‘««—µ∂ÿ
¥—ßπ—πÈ RA ¡’Àπ૬‡ªìπ cd.m-2. lx-1
°“√®—¥«“ß√–∫∫«—¥§à“ RA
¿“æ∑’Ë 6 √Ÿª·∫∫°“√®—¥«“ß√–∫∫«—¥ RA
 √–∫∫«—¥§à“ RA µ“¡ Standard practice for
measuring photometric characteristics of
retroreflectors (ASTM: E809-08) ª√–°Õ∫¥â«¬
·À≈àß°”‡π‘¥· ß™π‘¥„ âÀ≈Õ¥∑—ß ‡µπ·∫π¥å«‘¥∑åµË”
(tungsten filament lamp) ∑”ß“π∑’ÕË ≥ÿ À¿Ÿ¡‘ Õ’ “â ßÕ‘ß
2856 Ì K ±20K (CIE source A) ©“¬· ß∑”¡ÿ¡ β
(entrance angle) °—∫·π«µ—Èß©“°¢Õߺ‘««—µ∂ÿµ—«Õ¬à“ß
∑”°“√«—¥ª√‘¡“≥· ß –∑âÕπ®“°º‘«‚¥¬®—¥«“ßÀ—««—¥∑”
¡ÿ¡ α (observation angle) °—∫·π«· ß®“°·À≈àß°”‡π‘¥
°“√√“¬ß“πº≈®÷߇ªìπ°“√· ¥ß§à“ RA ∑’¡Ë ¡ÿ α
·≈– β µà“ß°—π‡æ◊ÕË · ¥ßª√– ∑‘ ∏‘¿“æ„π°“√ –∑âÕπ· ß
∑’¡Ë ¡ÿ µ°°√–∑∫µà“ß Ê ¢Õß«—µ∂ÿ∑¥ Õ∫
∑—È ß π’È «— µ ∂ÿ –∑â Õ π· ß„πß“π®√“®√®–µâ Õ ß
–∑âÕπ· ß à«π„À≠à´÷Ë߇°‘¥®“°· ß°√–∑∫ °≈—∫‰ª
¬—ß·À≈àß∑’Ë¡“„π≈—°…≥–°√«¬·§∫‚¥¬¡’· ßÀ—°‡À‡¢â“
π— ¬ πå µ “¢ÕߺŸâ ¢— ∫ √∂´÷Ë ß Õ¬Ÿà Ÿ ß °«à “‚§¡‰ø„π√–¥—∫ª°µ‘
Õ¬à“ßæՇ撬ß
®“°¿“æ∑’Ë 7 ‡ªìπµ“√“ßµ—«Õ¬à“ß§à“ RA ∑’¡Ë ¡ÿ α
´÷ßË ‡ªìπ¡ÿ¡¢ÕßÀ—««—¥· ß „π∑’πË ∑’È ”Àπâ“∑’·Ë ∑ππ—¬π嵓¢Õß
ºŸâ¢—∫√∂ ‡ÀÁπ‰¥â«à“ª√‘¡“≥· ß∑’Ë –∑âÕπ‡¢â“π—¬π嵓®–
¬—ߧߡ’Õ¬Ÿà‡¡◊ËÕ∂÷ß¡ÿ¡¡Õß∑’Ë 0.5 Õß»“ ‡¡◊ËÕ¡ÿ¡ α
¡“°°«à“π—πÈ · ß®–¡’ª√‘¡“≥πâÕ¬≈߇¡◊ÕË ‡∑’¬∫°—∫ª√‘¡“≥
· ßµ°°√–∑∫ ·µà¢âÕ ”§—≠§◊Õ ·¡â¡¡ÿ °√–∑∫ β ®–¡’
§à“¡“°∂÷ß 45 Õß»“ · ß°Á¬ß— §ß “¡“√∂ –∑âÕπ°≈—∫
‡¢â“ Ÿàπ—¬π嵓ºŸâ¢—∫¢’Ë ‰¥â ´÷Ë߇ªìπ‰ªµ“¡«—µ∂ÿª√– ߧå¢Õß
°“√º≈‘µ«—µ∂ÿ –∑âÕπ· ß„πß“π®√“®√π—πË ‡Õß

¿“æ∑’Ë 7 µ—«Õ¬à“ß°“√√“¬ß“πº≈°“√«—¥§à“ RA

‡Õ° “√Õâ“ßÕ‘ß

American Society for Testing and Materials. Standard Practice for Describing Retroreflection. E808-01.
In Annual book of ASTM standard. West Conshohocken : ASTM, 2010.
American Society for Testing and Materials. Standard Practice for Measuring Photometric Characteristics
of Retroreflectors. E809-08. In Annual book of ASTM standard. West Conshohocken : ASTM,2010.
American Society for Testing and Materials. Standard Test Method for Coefficient of Retroreflection of
Retroreflective Sheeting Utilizing the Coplanar Geometry. E810-03. In Annual book of ASTM
standard. West Conshohocken : ASTM, 2010.
Delta. Reflection and Retroreflection Technical Note. RS 101. [Online]. [cite dated 11 July 2011] Available
from internet: http://www.madebydelta.com/imported/images/documents/Roadsensors/ RS101.pdf.

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