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Development of inkjet-printed inverters
Ta-Ya Chu, Afshin Dadvand, Neil Graddage, Christophe Py, Stephen Lang,
and Ye Tao
Outline
• Introduction
1400
Interface interaction
1200
Solvents compatibility
1000
800
Drying process
600
Printing platform
400
200
0
1985 1990 1995 2000 2005 2010 2015
Year
Thermal evaporation
Spin coating Printing process
Polymer based transistor backplane is required for
flexible/bendable electronics in the future
Ag Organic
Dielectric Semiconductor
S D
PET Substrate
3-layer-printed OTFTs
Thin and uniform printed dielectric layer enabled by the
coffee ring effect
1000
Drop Spacing
600
Height [nm]
Difficult to achieve a pin-hole free of thin 400
Width [m]
600
1 Nozzle
550 2 Nozzles
3 Nozzles
500
450
400
Height [nm]
350
300
250
200
150
100
50
0
-50
-300 -200 -100 0 100 200 300
Organic Electronics 29 (2016) 114-119
Width [m]
3-layer-printed OTFTs mobility up to ~1 cm2/Vs at 15 V
PET Substrate
Average mobility of 0.86 cm2/Vs (variation σ~15%) with
3-layer-printed OTFTs on/off ratio of 105 obtained at 15 V.
-4
10 10 70
VDS=-15 V VGS (V) 1.4 Standard deviation 0.15 (17%)
-5
10 60 -1
8
-3 1.2
6 1.0
-7
2
-IDS (A)
-3
-7
40
-IDS (A)
10 -9 0.86
0.8
-11
4
1/2
10
-8 30 -13
(-IDS)
2 0.6
=1.0 cm /Vs -15
10
-9
2 20
0.4
10
-10 10
0 0.2
10
-11 0
2
0 2 4 6 8 10 12 14 16 0 2 4 6 8 10 12 14 16 18 20 420 OFETs (8 OFETs, 2%, mobility lower than 0.2 cm /Vs
are not counted for statistics)
-VG (V) VDS (V)
Input
2 Output
0
Vdd -2
Vout -4
Vin -6
Voltage (V)
-8
-10
-12
Channel length L= 5 µm, -14
Channel width -16
Drive transistor W=1 mm -18
Load transistor W=200 µm, -0.03 -0.02 -0.01 0.00 0.01 0.02 0.03
Time (sec)
Vdd=-20V, 100 Hz
Printed logic gates NAND, AND, NOR and OR
0 Vin1 Table 1. Truth tables for NAND, AND, NOR and OR logic gates
Output for the different logic gates
-10
Vin 1 Vin 2 NAND AND NOR OR
-20 1 1 0 1 0 1
0 Vin2 1 0 1 0 0 1
-10 0 1 1 0 0 1
-20 0 0 1 0 1 0
0
NAND
Voltage (V)
-4
2.5
Vout -6
Voltage (V)
Vin
Delay time (ms)
2.0 -8
-10
1.5 -12
-14
1.0 -16
Gain
-8 5
Delay time is dominated by the resistance -10 4
-12 3
2
-14
1
-16
0
-14 -12 -10 -8 -6 -4 -2 0
Vin (V)
Development of printed CMOS inverter
3-Layer-Printed NDI2OD-T2
Ag
N type transistor SOG Dielectric
N-type semiconductor
S D
1E-7 2.5
IDS()
1E-11
300 0.05 9.7 5.0E-07 7.15E-12 7.0E+05
0 0.0
0 5 10 15 20 0 5 10 15 20 220 0.10 8.4 8.8E-06 6.24E-11 1.4E+05
VDS(V) VGS(V)
180 0.12 4.1 1.5E-05 6.70E-10 4.0E+04
Difficulties
Compatible processing condition for
both P and N type materials
Compatible IV characteristics
Stability between P and N
Vin DPP-DTT
P-type semiconductor
NDI2OD-T2
N-type semiconductor
P N Vin
Ag Ag
Dielectric Dielectric
Vdd P Vout N Ground
12
Output (V)
10
8
24 24
10 V 6
21 15 V 21 4
20 V
2
18 25 V 18
0
-0.3 -0.2 -0.1 0.0 0.1 0.2 0.3
15 15 20 Time (sec)
Gain
Output
Vds(V)
18 Input
12 12
16
After 80 hrs
9 9 14
12
6 6
Vout 10
3 3 8
6
0 0
25 20 15 10 5 0 4
Vgs(V) 2
0
0.0 0.5 1.0 1.5 2.0 2.5
Time (sec)
Summary
NRCSummary
developed printing process for 3-layer-printed OFETs, mobility of 1 cm2/Vs on
PMOS and 0.1 cm2/Vs on NMOS transistors have been achieved.
Introduced coffee ring effect to achieve thin and uniform dielectric layer by inkjet
printing process.
Gain value of 24 with a nearly full-swing of output voltage obtained from the printed
CMOS inverter.
Semiconductor
Printed circuits
Electrode Dielectric
Question?
15
16